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Comment on “Interpretation of Fermi level pinning on 4H–SiC using synchrotron photoemission spectroscopy” [Appl. Phys. Lett.84, 538 (2004)]
5.W. Mönch, Semiconductor Surfaces and Interfaces, Third ed. (Springer, Berlin, 1995).
7.S. M. Sze, Physics of Semiconductor Device (Wiley, New York, 1981).
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