1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Threshold voltage instability characteristics under positive dynamic stress in ultrathin metal-oxide-semiconductor field-effect transistors
Rent:
Rent this article for
USD
10.1063/1.1805196
/content/aip/journal/apl/85/15/10.1063/1.1805196
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/15/10.1063/1.1805196
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic setup and several parameters for measuring threshold voltage instability of NMOSFET under ac dynamic stress.

Image of FIG. 2.
FIG. 2.

(a) Frequency dependence of threshold voltage instability characteristics at with 50% duty cycle. (b) Degradations of maximum transconductance and subthreshold swing under dc and ac unipolar stress for several frequencies.

Image of FIG. 3.
FIG. 3.

(a) Duty cycle dependence of threshold voltage instability characteristics at with 10 kHz frequency. (b) Degradations of maximum transconductance and subthreshold swing under dc and ac unipolar stress for different duty cycles.

Image of FIG. 4.
FIG. 4.

Threshold voltage instability characteristics of NMOSFETs under ac unipolar stress with thickness variation of SiON interface layer and .

Image of FIG. 5.
FIG. 5.

Ten-year lifetime extraction for NMOSFET under dc and ac unipolar stress.

Loading

Article metrics loading...

/content/aip/journal/apl/85/15/10.1063/1.1805196
2004-10-19
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Threshold voltage instability characteristics under positive dynamic stress in ultrathin HfO2 metal-oxide-semiconductor field-effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/15/10.1063/1.1805196
10.1063/1.1805196
SEARCH_EXPAND_ITEM