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Imaging of wavelength collective cavity resonances in intrinsic Josephson junction stacks under microwave irradiation
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View: Figures


Image of FIG. 1.
FIG. 1.

Current–voltage characteristic of sample #TC68 at . Gray points: no microwave irradiation; black points: microwave irradiation at . For the gray curve, on the negative side not all branches are traced out. Under microwave irradiation, a large step-like structure is visible near ; multiple smaller steps are marked by arrows. The upper inset shows the curve without microwave irradiation on large current and voltage scales. The lower inset shows a schematic view of the sample.

Image of FIG. 2.
FIG. 2.

IVC of sample #TC63 measured in the LTSEM at for . Gray arrows mark two small resonant structures. Inset (a) surface SEM picture, in which the stack is visible as a thin vertical line (see white arrow). Insets (b), (c), and (d) LTSEM pictures for bias points as indicated by bent arrows; maximum voltage modulation : (b), (c), and (d).

Image of FIG. 3.
FIG. 3.

Surface (top) and LTSEM (bottom) images of resonances with maximum value observed at for (a) a 11-junction stack ( resonance) and (b) a 11-junction stack ( resonance). Maximum voltage modulation : (a) and (b) .


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Imaging of μm wavelength collective cavity resonances in Bi2Sr2CaCu2O8+x intrinsic Josephson junction stacks under microwave irradiation