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Characterization of multiple interfaces in silicon-on-insulator materials via second-harmonic generation
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10.1063/1.1807011
/content/aip/journal/apl/85/15/10.1063/1.1807011
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/15/10.1063/1.1807011
/content/aip/journal/apl/85/15/10.1063/1.1807011
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/content/aip/journal/apl/85/15/10.1063/1.1807011
2004-10-19
2015-04-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of multiple Si∕SiO2 interfaces in silicon-on-insulator materials via second-harmonic generation
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/15/10.1063/1.1807011
10.1063/1.1807011
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