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AFM scans from surfaces before (top) and after (bottom) annealing at in air. The -scale is .
Root-mean-square roughness of surface annealed in air or for at different temperatures.
characteristics from diodes. The contacts were deposited on samples annealed under different ambients (air or ) at different temperatures.
Schottky barrier properties of contacts on that were annealed under different ambients and different temperatures prior to contact deposition.
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