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XRD scans of the thin film on substrate; the inset shows XRD scans from film and substrate.
Cross-sectional TEM images from on substrate, (a) low magnification image; (b) corresponding SAD pattern from and ; (c) high resolution image showing the interface between and .
XRD scans of films grown on substrate at 1000, 1100, and , respectively. The inset shows the enlarged diffraction patterns near peaks.
AFM images of the films annealed at (a) and (b) .
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