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Mechanical aspects of epitaxial ferroelectric films investigated by nanoindentation methods and piezoresponse force microscopy
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10.1063/1.1806563
/content/aip/journal/apl/85/16/10.1063/1.1806563
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/16/10.1063/1.1806563
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Piezoresponse amplitude (a) and phase (b) images consist of three regions: A. peripheral as-grown area; B. intermediate area biased with ; and . central area biased with . Both (a) and (b) were taken later after domain reversal.

Image of FIG. 2.
FIG. 2.

Indentation modulus and hardness profiles (a) from various domain areas of the PZT thin film shows anomalous results. Note that indent locations 1 and 2 are near a domain wall as confirmed by the PFM phase (b) and surface topography (c) images.

Image of FIG. 3.
FIG. 3.

AFM topography (a) and piezoelectric response amplitude (b) images after indentation at location 1.

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/content/aip/journal/apl/85/16/10.1063/1.1806563
2004-10-22
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Mechanical aspects of epitaxial ferroelectric Pb(Zr0.5Ti0.5)O3 films investigated by nanoindentation methods and piezoresponse force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/16/10.1063/1.1806563
10.1063/1.1806563
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