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Spectral reflectivity of the W gratings and flat W at the incident angle of measured with a diffuse reflection geometry at room temperature. The incident beam is randomly polarized. The downward arrows denote for the three gratings. The inset shows a scanning electron micrograph of sample C.
Schematic diagram showing the apparatus for the emission measurement and TPV generation demonstration.
Spectral emissivity of the W gratings and a flat W at the normal direction. Solid line with circles represents an emissivity spectrum reported in the literature Ref. 10.
Selective emission efficiency of the W gratings, flat W, and for as functions of radiator temperature.
of the photodiode radiated by several radiators as functions of radiator temperatures.
of the photodiode radiated by several radiators as functions of the total incident emissive power, . The numbers beside the symbols denote radiator temperatures.
Structural parameters of the W gratings.
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