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Near-field optical beam-induced currents in solar cells: Direct measurement of enhanced photoresponse at grain boundaries
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View: Figures


Image of FIG. 1.
FIG. 1.

(Color online) Schematic representation of near-field optical beam induced current (n-OBIC) of polycrystalline- solar cell. The titanium backcontact was photolithographically patterned and selectively etched to reveal the -thick backcontact layer over a window. The NSOM tip photoinjects carriers within a subwavelength volume ( spot, indicated in red). Device structure is shown at the right (for a more detailed description see the text).

Image of FIG. 2.
FIG. 2.

(Color online) (a) Left: Topographic image of polycrystalline- solar cell within a lithographically defined and selectively etched portion of the sample, wherein the Ti backcontact was selectively etched away. Right: Simultaneously acquired near-field optical beam induced current image [color scale in nm(nA)]. (b) Line scans extracted from n-OBIC image above as indicated by horizontal dashed lines: Triangles: lower-line; squares: upper-line. (c) Additional representative photocurrent line scans traversing grain boundaries in other regions of the sample.

Image of FIG. 3.
FIG. 3.

Real-space energy band diagram depicting predicted band-bending near grain boundaries, promoting charge separation of photoinjected electrons and holes at grain boundaries (labeled GB).


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near-field optical beam-induced currents in CdTe∕CdS solar cells: Direct measurement of enhanced photoresponse at grain boundaries