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Spectroscopic second harmonic generation measured on plasma-deposited hydrogenated amorphous silicon thin films
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10.1063/1.1812836
/content/aip/journal/apl/85/18/10.1063/1.1812836
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/18/10.1063/1.1812836
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Polar plot of for (a) -polarized and (b) -polarized SH signals from the -thick film as a function of the input polarization of the pump radiation with a photon energy of . The sample has been probed from the film-surface side of the sample at an incident angle of 45°. The half wave plate position of and 180° (90° and 270°) corresponds to a - polarized pump beam.

Image of FIG. 2.
FIG. 2.

of the -thick film probed from the film-surface side as a function of the pump photon energy and the corresponding SH photon energy. Data are given for the polarization configurations (▵), (엯) and (▾) for an angle of incidence of 45°.

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/content/aip/journal/apl/85/18/10.1063/1.1812836
2004-11-03
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic second harmonic generation measured on plasma-deposited hydrogenated amorphous silicon thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/18/10.1063/1.1812836
10.1063/1.1812836
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