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Critical point energy as a function of electric field determined by electroreflectance of surface-intrinsic- type doped
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10.1063/1.1814794
/content/aip/journal/apl/85/18/10.1063/1.1814794
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/18/10.1063/1.1814794
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The ER spectra of for of various .

Image of FIG. 2.
FIG. 2.

Plot of as a function of , the values of and can be evaluated from the intercepts at the axis and the slopes of the fitting lines.

Image of FIG. 3.
FIG. 3.

The strengths of the electric field in the undoped layer are plotted against . The solid line is a linear fitting to the data.

Image of FIG. 4.
FIG. 4.

The values of as a function of for various .

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/content/aip/journal/apl/85/18/10.1063/1.1814794
2004-11-03
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Critical point energy as a function of electric field determined by electroreflectance of surface-intrinsic-n+ type doped GaAs
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/18/10.1063/1.1814794
10.1063/1.1814794
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