1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High-power-density fault-current limiting devices using superconducting films and high-resistivity alloy shunt layers
Rent:
Rent this article for
USD
10.1063/1.1812572
/content/aip/journal/apl/85/19/10.1063/1.1812572
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/19/10.1063/1.1812572

Figures

Image of FIG. 1.
FIG. 1.

Schematic of YBCO thin-film fault-current limiting element with a alloy shunt layer.

Image of FIG. 2.
FIG. 2.

Voltage across the shunt layer and current flowing through sample No. 1 during a switching operation.

Image of FIG. 3.
FIG. 3.

Voltage across the shunt layer and the supply current flowing through sample No. 2 and a parallel noninductively wound shunt resistor during a switching operation.

Tables

Generic image for table
Table I.

Thickness of alloy shunt layers and room-temperature resistance of ∕YBCO∕sapphire fault-current limiting elements. The calculated resistance and resistivity of the shunt layers are also shown.

Loading

Article metrics loading...

/content/aip/journal/apl/85/19/10.1063/1.1812572
2004-11-08
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High-power-density fault-current limiting devices using superconducting YBa2Cu3O7 films and high-resistivity alloy shunt layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/19/10.1063/1.1812572
10.1063/1.1812572
SEARCH_EXPAND_ITEM