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Real-time evolution of the indium tin oxide film properties and structure during annealing in vacuum
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10.1063/1.1771456
/content/aip/journal/apl/85/2/10.1063/1.1771456
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/2/10.1063/1.1771456
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Evolution of XRD patterns during annealing in a vacuum.

Image of FIG. 2.
FIG. 2.

The temperature dependence during annealing of the XRD integral intensity of the (222) peak along with the EMA roughness (a), resistivity and free-electron density (b), and refractive index at two wavelengths (c).

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/content/aip/journal/apl/85/2/10.1063/1.1771456
2004-07-08
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real-time evolution of the indium tin oxide film properties and structure during annealing in vacuum
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/2/10.1063/1.1771456
10.1063/1.1771456
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