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A TEM image of a large Tl-1223 grain. The thickness of the film is about . No defects are found in it except a crack, which must have been introduced during the thinning process, along an arrow.
(a) HRTEM image of an area at the interface, to which the  direction of Tl-1223 is normal and the direction of Ag is almost normal. (b) The ED pattern corresponding to (a). Electrons are incident along the 100 ZA of the Tl-1223 and almost along the 110 ZA of Ag. (c) An ED pattern taken from an area of the interface, to which the  direction of Tl-1223 is normal and the direction of Ag is almost normal. Electrons are incident along the 110 ZA of the Tl-1223 and almost along the 112 ZA of Ag.
(a) A HRTEM image enlarged from a part of Fig. 2(a) with reversed contrast. The probable sites for metal atoms are plotted. (b) A cross-sectional view of the interface, transferred from (a). The plane contacts the Ag plane, which consists of terraces and steps (dotted lines), at the interface.
A plan-view of the interface, in which sites of Cu just above the interface and those of Ag just below the interface are drawn. The calculated distances between Cu and Ag as well as those between Ag and O are plotted in Å unit. Terraces and steps extend parallel to the  direction of Ag (longitudinal direction). The crystallographic directions indicated in the figure are for Tl–1223.
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