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Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces
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10.1063/1.1818343
/content/aip/journal/apl/85/20/10.1063/1.1818343
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/20/10.1063/1.1818343
/content/aip/journal/apl/85/20/10.1063/1.1818343
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/content/aip/journal/apl/85/20/10.1063/1.1818343
2004-11-16
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/20/10.1063/1.1818343
10.1063/1.1818343
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