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Optimization of ridge height for the fabrication of high performance ridge waveguide lasers with pulsed anodic oxidation
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10.1063/1.1824180
/content/aip/journal/apl/85/20/10.1063/1.1824180
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/20/10.1063/1.1824180

Figures

Image of FIG. 1.
FIG. 1.

Light output power vs injection current characteristics of lasers with different ridge height of 0.39, 1.23, and , respectively. The cavity length for all the lasers is , with contact ridge width of .

Image of FIG. 2.
FIG. 2.

(a) Logarithm of threshold current density, , vs inverse cavity length for lasers of different ridge height of 0.39, 1.23, and , respectively, with contact ridge width of . For each height, the laser cavity length ranged from 500 to . (b) Transparency current density of lasers with different ridge height of 0.39, 0.80, 1.23, 1.55, and , respectively.

Image of FIG. 3.
FIG. 3.

Light output power vs injection current characteristics for a laser diode with ridge height ; the inset shows the emission spectra of the same laser with the injection current of .

Image of FIG. 4.
FIG. 4.

(a) Inverse external quantum efficiency as a function of TQW RWG laser cavity length , with contact ridge width of , ridge height of . The internal quantum efficiency and internal optical loss were determined to be 92% and , respectively. (b) Logarithm of threshold current density, , as a function of TQW RWG laser inverse cavity length . The transparency threshold current density was determined to be (equivalent to per well).

Tables

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Table I.

Strain-compensated laser structure.

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/content/aip/journal/apl/85/20/10.1063/1.1824180
2004-11-15
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optimization of ridge height for the fabrication of high performance InGaAsN ridge waveguide lasers with pulsed anodic oxidation
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/20/10.1063/1.1824180
10.1063/1.1824180
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