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(a) Representative XRD pattern for sample (inset shows the fitted peaks for ZnS and ZnO); (b) representative TEM micrograph showing the particle size distribution (magnification: ).
Variation in Raman shifts for different capping thickness in samples; 1 represents 0% ZnO, 2 represents 50% ZnO, and 3 represents 100% ZnO.
Representative XPS spectra of (for 50% ZnO capping) showing the relative change in counts of the oxygen/sulfur ratio with sputtering time (inset shows a schematic model of our ZnO capped ZnS:Mn samples and effect of sputtering).
Representative PL spectra of the samples (inset shows the corresponding optical absorption pattern).
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