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XRD spectra of measurements showing the reflections in films with different sulfur content.
Grazing incidence phi scans recorded at and which display a sixfold symmetry.
A comparison of XPS spectra of and . The composition of the layers were calculated using the , , and signals.
The change in the -axis lattice constant of films as a function of the sulfur content calculated using XRD results and the correlation with the composition as determined by XPS.
Optical transmission spectra of films with different compositions. The ascending numbering is a sign of the decreasing sulfur content.
Band gap energy of films as a function of the composition .
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