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Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy
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10.1063/1.1827334
/content/aip/journal/apl/85/21/10.1063/1.1827334
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/21/10.1063/1.1827334
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Figures

Image of FIG. 1.
FIG. 1.

The mid-infrared vibrational resonance spectrum of PMMA; (a) measured dielectric function from ellipsometry (Ref. 22), (b) calculated far-field absorption and reflectivity , (c) calculated s-SNOM amplitude and phase assuming Si as reference material, measurable in a setup as sketched in (d).

Image of FIG. 2.
FIG. 2.

Frequency-dependent near-field contrast of PMMA; (a) topography (left) and infrared amplitude (right) s-SNOM images of a 50-nm-thick PMMA film on Si, at two frequencies indicated, (b) near-field amplitude contrast of PMMA relative to Si, extracted from near-field images (data points), and predicted from theory with proper account of tip modulation amplitude and second-harmonic signal demodulation (full curve), and same offset by 0.18 (dashed curve).

Image of FIG. 3.
FIG. 3.

Infrared near-field contrast of PS in PMMA matrix; (a) calculated s-SNOM amplitude spectra of PMMA (full curve) and of PS (dashed curve), (b) topography (left) and infrared amplitude (right) s-SNOM images of 70-nm-thick polymer blend film on Si, at three different frequencies indicated. The extracted infrared contrast of PMMA relative to PS, obtained by averaging over the rectangular regions indicated in the topography, is shown as experimental data points in (a).

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/content/aip/journal/apl/85/21/10.1063/1.1827334
2004-11-23
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/21/10.1063/1.1827334
10.1063/1.1827334
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