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Focused-ion-beam-induced deposition of superconducting nanowires
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10.1063/1.1842367
/content/aip/journal/apl/85/25/10.1063/1.1842367
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/25/10.1063/1.1842367

Figures

Image of FIG. 1.
FIG. 1.

Scanning electron microscopy picture of a superconducting wire, synthesized by IBID, in a four-point contact configuration for transport measurements. Its dimensions are , and , in length, width, and thickness, respectively. Scale bar is .

Image of FIG. 2.
FIG. 2.

Resistivity vs temperature for magnetic fields applied perpendicular to the superconducting wire from 0 to .

Image of FIG. 3.
FIG. 3.

Upper critical field vs temperature deduced from the resistivity data. The dashed line is a fit to a power law. The upper critical field, , and the coherence length, , are 9.5 T and 5.9 nm, respectively.

Tables

Generic image for table
Table I.

Electron probe microanalysis (EPMA) of an IBID fabricated superconducting thin film. The film dimensions are , in length and width, and in thickness. The EPMA data are collected at both the center and edge of the film. The average of the two values is also presented. This data show that the concentration of the elements, , , and , is essentially uniform over the whole film.

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/content/aip/journal/apl/85/25/10.1063/1.1842367
2004-12-15
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Focused-ion-beam-induced deposition of superconducting nanowires
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/25/10.1063/1.1842367
10.1063/1.1842367
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