No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Composition measurement in strained epitaxial layers using x-ray diffraction
1.Q. Paduano, D. Weyburne, and S.-Q. Wang, Phys. Status Solidi A 188, 821 (2001).
2.H. Angerer, D. Brunner, F. Freudenberg, O. Ambacher, M. Stutzmann, R. Hopler, T. Metzger, E. Born, G. Dollinger, A. Bergmaier, S. Karsch, and H. J. Korner, Appl. Phys. Lett. 71, 1504 (1997).
5.C. Kisielowski, J. Kruger, S. Ruvimov, T. Suski, J. W. Ager III, E. Jones, Z. Liliental-Weber, M. Rubin, E. R. Weber, M. D. Bremser, and R. F. Davis, Phys. Rev. B 54, 17745 (1996).
6.V. A. Savastenco and A. U. Sheleg, Phys. Status Solidi A 48, K135 (1978).
7.Y. Takagi, M. Ahart, T. Azuhata, T. Sota, K. Suzzki, and S. Nakamura, Physica B 219/220, 547 (1996).
17.S. Keller, G. Parish, P. T. Fini, S. Heikman, C. H. Chen, N. Zhang, S. P. Denbaars, U. K. Mishra, and Y. F. Wu, J. Appl. Phys. 86, 5850 (1999).
18.Note, this is not the same as assuming Vegard’s law for the and lattice parameters since, because the and ratios differ, a deviation from linearity must occur for one of these spacings. The difference between these two assumptions is of order 0.1% in estimated content at 30% .
19.I. Akasaki and H. Amano, in Properties of Group III Nitrides Emis Data Reviews Series No. 11 (INSPEC, 1994), Chap. 1.4.
20.W. J. Meng, in Properties of Group III Nitrides Emis Data Reviews Series No. 11 (INSPEC, 1994), Chap. 1.3.
Article metrics loading...
Full text loading...
Most read this month