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X-ray diffraction pattern of (a) a substrate, (b) with Sn (ITO) film, and (c) 5% Mn–ITO film on a substrate.
High-resolution cross-sectional transmission electron microscopy images of 5% Mn–ITO showing no indication of any secondary phase or clustering of Mn ions. In the inset a lower magnification HRXTEM image and the  selected area diffraction pattern are shown.
Magnetic hysteresis loops taken at for (a) and on sapphire. (b) Variation of magnetization with the temperature for a thick film of on taken with a field of applied ( is applied parallel to the film plane). The field-cooled data are denoted by squares (∎) whereas the zero-field cooled data are denoted by circles (엯). The inset shows the magnetic hystersis loop for the same film.
Hall resistance, as a function of the magnetic field for at , showing an anomalous contribution due to charge carrier spin polarization. The inset shows the same but at .
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