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Quantitative analysis of nanoscale switching in thin filmsby piezoresponse force microscopy
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10.1063/1.1775881
/content/aip/journal/apl/85/5/10.1063/1.1775881
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/5/10.1063/1.1775881
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Polarization hysteresis loops measured in the SBT film using the Pt top electrode. Schematics of the polarization switching process in the macroscopic hysteresis loop measurements (b) and in the PFM experiment (c).

Image of FIG. 2.
FIG. 2.

Surface topography (a), vertical (b), and lateral (c) PFM signal of SBT thin film.

Image of FIG. 3.
FIG. 3.

Vertical (a) and lateral (b) piezoelectric hysteresis loops for grains in Fig. 2. For clarity, vertical loops are shown only for grains 1, 2, and 3.

Image of FIG. 4.
FIG. 4.

(a) Corrected hysteresis loop and corresponding fit by Eq. (3) for positive and negative tip biases. (b) Correlation between maximal switchable polarization and coercive voltage .

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/content/aip/journal/apl/85/5/10.1063/1.1775881
2004-07-27
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin filmsby piezoresponse force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/5/10.1063/1.1775881
10.1063/1.1775881
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