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XRD patterns of thin films on (a) -plane and (b) -plane sapphire substrates. Intensities are in logarithmic scale.
The reciprocal space map of on -plane sapphire. The solid lines which connect 004 peak and the mixed peaks of are not perpendicular to direction, which is the distinctive characteristic of monoclinic -phase.
Cross-sectional TEM image of the thin film on -plane sapphire. Interface is specified with the closed triangle.
Temperature dependence of electrical resistivity in (a) and (b) films. Measurements were performed in the parallel direction to layers for films on -plane sapphire, and both parallel and perpendicular directions for films on -plane sapphire.
Temperature dependence of Seebeck coefficient in films on -plane sapphire. Measurements were performed in both parallel and perpendicular directions in respect to layers.
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