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Anisotropic thermoelectric properties in layered cobaltite ( and ) thin films
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10.1063/1.1776310
/content/aip/journal/apl/85/5/10.1063/1.1776310
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/5/10.1063/1.1776310
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of thin films on (a) -plane and (b) -plane sapphire substrates. Intensities are in logarithmic scale.

Image of FIG. 2.
FIG. 2.

The reciprocal space map of on -plane sapphire. The solid lines which connect 004 peak and the mixed peaks of are not perpendicular to direction, which is the distinctive characteristic of monoclinic -phase.

Image of FIG. 3.
FIG. 3.

Cross-sectional TEM image of the thin film on -plane sapphire. Interface is specified with the closed triangle.

Image of FIG. 4.
FIG. 4.

Temperature dependence of electrical resistivity in (a) and (b) films. Measurements were performed in the parallel direction to layers for films on -plane sapphire, and both parallel and perpendicular directions for films on -plane sapphire.

Image of FIG. 5.
FIG. 5.

Temperature dependence of Seebeck coefficient in films on -plane sapphire. Measurements were performed in both parallel and perpendicular directions in respect to layers.

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/content/aip/journal/apl/85/5/10.1063/1.1776310
2004-07-27
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Anisotropic thermoelectric properties in layered cobaltite AxCoO2 (A=Sr and Ca) thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/5/10.1063/1.1776310
10.1063/1.1776310
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