Full text loading...
(a) Schematic of the setup for current noise measurement. The source, drain, and quantum dot regions are schematically illustrated in the scanning electron micrograph. (b) Current profile of a single-electron tunneling peak when is swept. Each trace is offset for clarity. Lines show current steps associated with the energy alignment. (c) Frequency spectrum of the current fluctuation. The dashed line shows dependence.
(a) Single-electron current profile obtained at . (b) The derivative of the current spectra. (c) The magnitude of the current fluctuation integrated from 5 to . Vertical lines indicate the conditions, and .
(a) Temperature dependence of the current fluctuation. Open and solid circles are obtained at and , respectively. (b) The derivative of the current spectra. The dashed line is the expected curve from the thermal broadening. (c) Square of the potential fluctuation.
(a) Source–drain voltage dependence of the potential fluctuation. and indicate the threshold voltage for exciting the quantum dot. (b) Energy diagram of single-electron transport at . (c) Energy diagram at .
Article metrics loading...