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Comparative study of magnetization reversal in isolated and strayfield coupled microcontacts
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10.1063/1.1777824
/content/aip/journal/apl/85/7/10.1063/1.1777824
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/7/10.1063/1.1777824
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Figures

Image of FIG. 1.
FIG. 1.

and sized microcontacts deposited apart on a membrane. The layer sequence is , , Ni, and . A field of is applied along the short direction of the structure. (a) Simulated magnetization pattern at . (b) Measured MTXM image at and (c) at . (d) Simulated MFM image at , (e) measured MFM image at , and (f) at .

Image of FIG. 2.
FIG. 2.

Isolated sized microcontact. From the simulated magnetization pattern in (a) an MFM image is calculated (b) assuming a distance of between detecting dipole and sample reasonable for the experimental lift-scan height of (see Ref. 16). Measured MTXM images for applied fields of (c) , (e) , (g) , and (i) (saturated). The corresponding MFM images are shown in (d), (f), (h), and (j). The direction of the applied field is indicated by an arrow.

Image of FIG. 3.
FIG. 3.

(a) MTXM and (b) MFM image of an isolated microcontact at remanence. In (c) and (d), simulated images are shown. (c) Micromagnetic simulation of (a) indicating a perfect agreement with the MTXM signal. (d) Simulated MFM image obtained from a modified OOMMF simulation (see Ref. 16) in concordance with the MFM image (b).

Image of FIG. 4.
FIG. 4.

Magnetic domain structures of the microcontacts shown in Fig. 1 in a field of applied along the short axis. (a) MTXM image indicating a symmetric coupling between the closure domains in the upper and lower contacts. (b) Sketch of the domain-wall positions. The vertical solid lines in the lower structure indicate cross-tie walls. Dashed lines are to guide the eye in regions of weak signal. (c) Simulated magnetization pattern.

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/content/aip/journal/apl/85/7/10.1063/1.1777824
2004-08-10
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Comparative study of magnetization reversal in isolated and strayfield coupled microcontacts
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/7/10.1063/1.1777824
10.1063/1.1777824
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