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Measurements of low-frequency noise spectral densities for a small-sized stack of intrinsic Josephson junctions of single crystal
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10.1063/1.1780601
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    Affiliations:
    1 Department of Electrical Engineering, Yamagata University, 4-3-16 Johnan, Yonezawa, 992-8510 Japan
    2 Department of Electrical Engineering, Nagaoka University of Technology, 1-1603 Kamitomioka, Nagaoka, 940-2188 Japan
    3 Department of Electrical and Electronics Engineering, Utsunomiya University, 2753 Ishii, Utsunomiya, 321-8585 Japan
    a) Electronic mail: atsu@yz.yamagata-u.ac.jp
    Appl. Phys. Lett. 85, 1196 (2004); http://dx.doi.org/10.1063/1.1780601
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/content/aip/journal/apl/85/7/10.1063/1.1780601
2004-08-10
2014-11-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurements of low-frequency noise spectral densities for a small-sized stack of intrinsic Josephson junctions of Bi2Sr2CaCu2Oy single crystal
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/7/10.1063/1.1780601
10.1063/1.1780601
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