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Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
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10.1063/1.1784035
/content/aip/journal/apl/85/8/10.1063/1.1784035
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/8/10.1063/1.1784035
/content/aip/journal/apl/85/8/10.1063/1.1784035
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/content/aip/journal/apl/85/8/10.1063/1.1784035
2004-08-17
2015-01-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/8/10.1063/1.1784035
10.1063/1.1784035
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