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(a) HRTEM micrograph at the interface in the system. Steps in the substrate surface have been determined, as well as a typical pinhole contrast in that area.
(a) Filtered image of the step 2 (in Fig. 1), showing the decomposition of a step into two different steps with heights . Extra-planes in the AlN are indicated by arrows.
Schematic illustration of the steps exhibited in Fig. 2: (a) the step, (b) the step. In (a), the associated disconnection separates distinct interfacial structures, while in (b) the defect delineates energetically degenerate interfacial structures at the adjacent terraces.
(Color online) Proposed mechanism for the pinhole origin in . Steps with different height in the (111) Si surface have been marked with A to C. The thickness of the cross section HRTEM specimen has been represented with dotted lines (see the two arrows terminated black line).
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