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(Color online). Schematics showing the crystal structures of InGaAs (zinc blende) and ErAs (rock salt).
Cross-section many-beam TEM micrographs of the superlattice structure. White labels in (a) indicate the amount of ErAs for the different layers; (b) and (c) are higher magnification images of layers with 1.2 and 0.15 ML ErAs, respectively.
(Color online). HAADF-STEM micrographs of ErAs particles from layers with Er depositions corresponding to (a) 1.2 ML and (b) 1.4 ML ErAs, respectively. The substrate–side interface between the particle and matrix is highlighted by the dotted lines in (a). The arrow indicates the growth direction. Statistically insignificant frequency components were removed by Fourier filtering with a large circular aperture.
(Color online). HAADF-STEM micrograph of an ErAs particle. The dumbbells in the matrix (spacing ) are resolved. The intensity profile (left bottom corner) across the dumbbells shows different intensities in the As and atomic columns due to the atomic number sensitivity of the image. The overlay shows the atomic positions obtained directly from the image. Statistically insignificant frequency components were removed by Fourier filtering with a large circular aperture.
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