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Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
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10.1063/1.1887821
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    Affiliations:
    1 Laboratoire de Physique de l’Etat Condensé, UMR CNRS 6087, Université du Maine, 72085 Le Mans Cedex 09, France
    2 Max-Planck-Institute of Colloids and Interfaces, Am Muhlenberg, Potsdam D-14424, Germany
    3 Laboratoire de Chimie Moléculaire et Organisation du Solide, UMR 5637 CNRS, Université de Montpellier II, Place E. Bataillon, F-34095 Montpellier Cedex 5, France
    4 Brookhaven National Laboratory, Department of Physics, Upton, New York, 119730-5000
    5 Laboratoire de Physique de l’Etat Condensé, UMR CNRS 6087, Université du Maine, 72085 Le Mans Cedex 09, France
    a) Author to whom correspondence should be addressed; electronic mail: gibaud@univ-lemans.fr
    Appl. Phys. Lett. 86, 113108 (2005); http://dx.doi.org/10.1063/1.1887821
/content/aip/journal/apl/86/11/10.1063/1.1887821
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/11/10.1063/1.1887821

Figures

Image of FIG. 1.
FIG. 1.

Idealized model used to fit the reflectivity data. Films are considered to be made of Layer 1 either composed of surfactant/pores and silica (respectively, before rinsing and after rinsing) of thickness electron density , and a roughness and of Silica layer 2 of thickness with an electron density , and a roughness . The in-plane spacing between pores or micelles is denoted as b. For clarity, the figure shows only 3 layers out of the layers really present in the films. The roughness of the layers is not shown in the picture. Films are supported by a glass substrate and silica cap and buffer layers are also introduced in the model.

Image of FIG. 2.
FIG. 2.

GISAXS results of the rinsed film showing the 2D hexagonal structure.

Image of FIG. 3.
FIG. 3.

Raman scattering experiments showing the disappearance of the stretching bands located around that confirm the removal of the surfactant upon rinsing. The Raman signals are normalized to the nitrogen peak located at .

Image of FIG. 4.
FIG. 4.

Absolute reflectivity curves of the initial (a) and rinsed films (b). The top inset gives the electron density profile obtained from a fit via the matrix technique to the experimental data. The bottom inset shows a magnified view of the region below the critical angle. The value reported along the line is the average critical wave vector of the film. The modifications induced by the rinsing procedure are obvious both on the electron density profiles and on the average critical wave vector.

Tables

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Table I.
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/content/aip/journal/apl/86/11/10.1063/1.1887821
2005-03-11
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/11/10.1063/1.1887821
10.1063/1.1887821
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