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Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
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10.1063/1.1887821
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    Affiliations:
    1 Laboratoire de Physique de l’Etat Condensé, UMR CNRS 6087, Université du Maine, 72085 Le Mans Cedex 09, France
    2 Max-Planck-Institute of Colloids and Interfaces, Am Muhlenberg, Potsdam D-14424, Germany
    3 Laboratoire de Chimie Moléculaire et Organisation du Solide, UMR 5637 CNRS, Université de Montpellier II, Place E. Bataillon, F-34095 Montpellier Cedex 5, France
    4 Brookhaven National Laboratory, Department of Physics, Upton, New York, 119730-5000
    5 Laboratoire de Physique de l’Etat Condensé, UMR CNRS 6087, Université du Maine, 72085 Le Mans Cedex 09, France
    a) Author to whom correspondence should be addressed; electronic mail: gibaud@univ-lemans.fr
    Appl. Phys. Lett. 86, 113108 (2005); http://dx.doi.org/10.1063/1.1887821
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/content/aip/journal/apl/86/11/10.1063/1.1887821
2005-03-11
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/11/10.1063/1.1887821
10.1063/1.1887821
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