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Local environment of dopant in by near-edge x-ray absorption fine structure analysis
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10.1063/1.1885175
/content/aip/journal/apl/86/12/10.1063/1.1885175
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1885175
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of -doped polycrystals with 5, 10, and and a thin film with .

Image of FIG. 2.
FIG. 2.

Observed NEXAFS spectra of edge from polycrystalline specimens with concentrations of 0.01, 5, 10, and . The spectra from and reference materials are also shown with characteristic peaks arrowed.

Image of FIG. 3.
FIG. 3.

Comparison of NEXAFS spectra between calculations and experiments for (a) , -doped , (b) polycrystal, and (c) thin film. and are the electric field vector and the vector perpendicular to the surface of the thin film, respectively. Thick and thin solid curves are experiments and calculations, respectively. Absolute transition energies of all theoretical spectra were shifted by .

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/content/aip/journal/apl/86/12/10.1063/1.1885175
2005-03-14
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Local environment of Mn dopant in ZnO by near-edge x-ray absorption fine structure analysis
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1885175
10.1063/1.1885175
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