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exchange spring multilayer films with high energy product
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10.1063/1.1889238
/content/aip/journal/apl/86/12/10.1063/1.1889238
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1889238

Figures

Image of FIG. 1.
FIG. 1.

XRD results for the as-deposited film and the films with different Cu thicknesses and 0.5 annealed at 450 °C for 30 min.

Image of FIG. 2.
FIG. 2.

In-plane and out-of-plane hysteresis loops of the film with annealed at 450 °C for 30 min.

Image of FIG. 3.
FIG. 3.

TEM bright field image of the film with annealed at 500 °C for 30 min.

Image of FIG. 4.
FIG. 4.

Electron energy loss spectroscopy (EELS) maps of Sm, Co, Fe, and Cu of the film with annealed at 500 °C for 30 min and the intensity profile of the elements obtained from the EELS maps.

Image of FIG. 5.
FIG. 5.

(a) Recoil curve and (b) dependence on the reverse field for the film with annealed at 450 °C for 30 min.

Tables

Generic image for table
Table I.

The coercivity , remanence , and maximum energy product of the films with different Cu thicknesses annealed at different temperatures for 30 min.

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/content/aip/journal/apl/86/12/10.1063/1.1889238
2005-03-18
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sm(Co,Cu)5∕Fe exchange spring multilayer films with high energy product
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1889238
10.1063/1.1889238
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