1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Potential imaging of /polycrystalline silicon gate stacks: Evidence for an oxide dipole
Rent:
Rent this article for
USD
10.1063/1.1890483
/content/aip/journal/apl/86/12/10.1063/1.1890483
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1890483
/content/aip/journal/apl/86/12/10.1063/1.1890483
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/86/12/10.1063/1.1890483
2005-03-17
2014-08-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Potential imaging of Si∕HfO2/polycrystalline silicon gate stacks: Evidence for an oxide dipole
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/12/10.1063/1.1890483
10.1063/1.1890483
SEARCH_EXPAND_ITEM