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Examining the screening limit of field effect devices via the metal-insulator transition
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10.1063/1.1897076
/content/aip/journal/apl/86/14/10.1063/1.1897076
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897076
/content/aip/journal/apl/86/14/10.1063/1.1897076
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/content/aip/journal/apl/86/14/10.1063/1.1897076
2005-03-28
2014-11-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Examining the screening limit of field effect devices via the metal-insulator transition
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897076
10.1063/1.1897076
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