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(Color online) XRD scans in Cu radiation for ceramic target (a), and heteroepitaxial film structures (b and c) grown on the single crystal recorded by Siemens D5000 powder diffractometer.
(Color online) The rocking curves of the (444) Bragg reflections from the heteroepitaxial structure. Inset: -scans of the oblique (642) planes in the and films and substrate.
(Color online) (a) Dispersion of the absorption of the light transmitted through the thick film on the crystal. (b) Reflectivity spectrum in film, normal incidence. The spectrum was normalized to the intensity of the light reflected from the clean GGG substrate. Dispersion of the refraction indexes: 엯 symbols are the experimental data obtained from the minima of the reflection spectra at normal incidence, ◇ and ◻ symbols are the experimental data obtained from the reflection spectra at oblique incidence (Fig. 4) for TE and TM mode, respectively. Solid line is the fitting of the dispersion of the ordinary refraction index to the Sellmeier formula shown in the panel. (c) Transmission and Faraday rotation spectra for thick film grown directly onto the and buffered single crystal.
(Color online) Angular and wavelength dependent reflectivity of TE and TM modes (“dark spectra”) in thick film grown onto the single crystal.
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