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XRD patterns from scans of the slowly cooled and fast cooled samples.
Reciprocal space maps around (a) PST (001) and NGO (110), (b) PST (103) and NGO (332), (c) PST (013) and NGO (420) for the slowly cooled sample, (d) PST (001) and NGO (110), (e) PST (103) and NGO (332), and (f) PST (013) and NGO (420) for the fast cooled sample.
The dielectric constants of slowly cooled and fast cooled samples at and room temperature as a function of the applied electric fields.
The and between the film and the substrate spots in the RSMs.
The lattice constant, strain, and tunability of the samples on different direction.
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