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Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise
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10.1063/1.1897423
/content/aip/journal/apl/86/14/10.1063/1.1897423
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897423
/content/aip/journal/apl/86/14/10.1063/1.1897423
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/content/aip/journal/apl/86/14/10.1063/1.1897423
2005-04-01
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897423
10.1063/1.1897423
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