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Aluminum nanoscale order in amorphous measured by fluctuation electron microscopy
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10.1063/1.1897830
/content/aip/journal/apl/86/14/10.1063/1.1897830
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897830
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The annular average of electron diffraction patterns from melt-spun samples as spun and after 6 and anneals. The patterns have been shifted vertically for clarity, and the vertical lines indicate the face-centered-cubic Al ⟨111⟩, ⟨200⟩, and ⟨220⟩ reflections.

Image of FIG. 2.
FIG. 2.

Fluctuation microscopy data for melt-spun as spun, 6, and annealed, and cold-rolled .

Image of FIG. 3.
FIG. 3.

Measured for melt-spun as spun and simulated for a Al sphere and a Sm-centered icosehedron. The Al sphere reproduces the peak positions and relative heights. The simulations have been multiplicatively scaled to match the data.

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/content/aip/journal/apl/86/14/10.1063/1.1897830
2005-04-01
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1897830
10.1063/1.1897830
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