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Experimental transmission of the thin wafer compared with transmission predicted by the analytic dielectric function (a) in the near-IR with interference and transmission enhanced and (b) raw transmission in the submillimeter region.
Experimental transmission for the thin wafer in the two-phonon region and predicted transmission with and without two-phonon effects.
Refractive index as a function of frequency from dielectric function model. Calculated values range from 0.028 to 21.1.
Extinction coefficient as function of frequency from dielectric function model.
Dielectric function parameters for axis from a fit to experimental data and for axis from modeling.
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