1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Infrared dielectric function of wurtzite aluminum nitride
Rent:
Rent this article for
USD
10.1063/1.1899233
/content/aip/journal/apl/86/14/10.1063/1.1899233
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1899233

Figures

Image of FIG. 1.
FIG. 1.

Experimental transmission of the thin wafer compared with transmission predicted by the analytic dielectric function (a) in the near-IR with interference and transmission enhanced and (b) raw transmission in the submillimeter region.

Image of FIG. 2.
FIG. 2.

Experimental transmission for the thin wafer in the two-phonon region and predicted transmission with and without two-phonon effects.

Image of FIG. 3.
FIG. 3.

Refractive index as a function of frequency from dielectric function model. Calculated values range from 0.028 to 21.1.

Image of FIG. 4.
FIG. 4.

Extinction coefficient as function of frequency from dielectric function model.

Tables

Generic image for table
Table I.

Dielectric function parameters for axis from a fit to experimental data and for axis from modeling.

Loading

Article metrics loading...

/content/aip/journal/apl/86/14/10.1063/1.1899233
2005-04-01
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Infrared dielectric function of wurtzite aluminum nitride
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/14/10.1063/1.1899233
10.1063/1.1899233
SEARCH_EXPAND_ITEM