1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Field emission characteristics of a tungsten microelectromechanical system device
Rent:
Rent this article for
USD
10.1063/1.1875756
/content/aip/journal/apl/86/15/10.1063/1.1875756
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/15/10.1063/1.1875756
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) A schematic illustration of a cylindrical ion trap; scanning electron microscopy micrographs of the cylindrical ion trap array: (b) top view (c) perspective, and (d) side view.

Image of FIG. 2.
FIG. 2.

Current-voltage characteristics of ion traps of in a array at atmospheric pressure. The inset shows the Fowler–Nordheim plot for this ion trap array at 150–300 V.

Image of FIG. 3.
FIG. 3.

The dependence of emission current, at atmosphere, on (a) the field strengths and (b) the array sizes for the device.

Image of FIG. 4.
FIG. 4.

Current-voltage characteristics of ion traps of in a array at a vacuum pressure of . The inset shows the Fowler–Nordheim plot for this ion trap array at 175–250 V.

Loading

Article metrics loading...

/content/aip/journal/apl/86/15/10.1063/1.1875756
2005-04-05
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Field emission characteristics of a tungsten microelectromechanical system device
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/15/10.1063/1.1875756
10.1063/1.1875756
SEARCH_EXPAND_ITEM