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TEM images of a sample rolled with thickness reduction of 45.5%, (a) bright-field and (b) dark-field images with its SAED pattern (inset) where the position of the objective aperture is illustrated.
Hardness values obtained from nanoindentation tests at various indentation depths.
(a) and (b) AFM images, (c) and (d) height profiles along the lines indicated in (a) and (b), respectively. The indents were formed at the maximum load of in the as-spun sample [(a) and (c)], and in the rolled sample with thickness reduction of 45.5% [(b) and (d)].
(a) HRTEM image showing a part of a shear band and its neighboring, undeformed, matrix in the sample rolled with thickness reduction of 45.5%, (b) image at the same position as (a), but defocused , Fourier filtered, threshold filtered, and inverted. The lines indicate the boundary between the shear band and undeformed region.
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