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(Color) Laser microscopy image (a) and three-dimensional atomic force microscopy image (b) of anisotropic noodle-like porous silicon substrate. A typical cross-section perpendicular to the noodle direction is also shown.
(Color) Schematic illustration of modulated structure of the SN–Co sample. Charge distribution of the film under a magnetic field perpendicular to the noodle direction is shown. Here is the thickness of the film; is the channel width; and are the height and width of the wall, respectively.
(Color) Atomic force microscopy image of RE–Co sample (a) and SN–Co sample (b).
(Color) Topographies (left) and corresponding domain structures (right) of RE–Co sample (a) and SN–Co sample (b) measured by magnetic force microscope
(Color) Hysteresis curves of SN–Co sample with magnetic field applied perpendicularly or parallel to the noodle direction. Also shown is the MH curve of RE–Co sample.
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