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Low symmetry phase in (001) epitaxial constrained thin films
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10.1063/1.1924891
/content/aip/journal/apl/86/18/10.1063/1.1924891
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/18/10.1063/1.1924891
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematics of (100) and (110) reflections, in the (H0L) and (HHL) scattering zones, respectively. (a) and (b) show splittings for the phase; (c) and (d) show splittings for the phase.

Image of FIG. 2.
FIG. 2.

(Color online) Schematics of the x-ray scattering measurements of different reflections in different scattering zones. The red solid lines in (b)–(f) are the incident and out-going x-ray beams. The purple lines in (c)–(f) are the normal direction of the (001) surface . (a) The original state of the sample without any rotation. (b) Measuring the (002) reflection in the (H0L) zone. (c) Measuring the (101) reflection in the (H0L) zone. Here the incident x-ray beam is blocked by the sample. (d) Measuring the (011) reflection in the (HKK) zone, defined by [100] and [011] vectors. Here the sample is rotated 45° around the axis first to put the [011] vector in the scattering zone. (e) Measuring (103) peak in the (H0L) zone. (f) Measuring (113) peak in the (HHL) zone, defined by the [110] and [001] vectors. Here the sample is rotated 45° around the -axis first to put the [110] vector in the scattering plane.

Image of FIG. 3.
FIG. 3.

(Color online) X-ray diffraction measurements around the (002), , and (113) Bragg reflections, performed in the (H0L), (HHL), and (HHL) scattering planes, shown in (a), (b), and (c), respectively.

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/content/aip/journal/apl/86/18/10.1063/1.1924891
2005-04-28
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low symmetry phase in (001) BiFeO3 epitaxial constrained thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/18/10.1063/1.1924891
10.1063/1.1924891
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