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Optical excitation of nanoelectromechanical oscillators
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10.1063/1.1919395
/content/aip/journal/apl/86/19/10.1063/1.1919395
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/19/10.1063/1.1919395

Figures

Image of FIG. 1.
FIG. 1.

Schematic of the laser interferometric optical setup.

Image of FIG. 2.
FIG. 2.

(a) Dependence of the response amplitude between the source and the clamped end of the beam (see inset) between Si (squares) and (circles). Dashed line represents a first-order exponential fit. (b) Transfer characteristics between the drive signal and the measured photodetector output. Inset shows frequency spectra for various driving signals. Dashed line represents a linear regression fit.

Image of FIG. 3.
FIG. 3.

Steady-state temperature distribution in (a) and (b) Si– stacks. (c) Transient response to a 10 MHz square wave signal at the surface of the Si device layer, where (A) , (B) , (C) , (D) , (E) , (F) , and (G) .

Tables

Generic image for table
Table I.

Material properties used for the calculations.

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/content/aip/journal/apl/86/19/10.1063/1.1919395
2005-05-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical excitation of nanoelectromechanical oscillators
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/19/10.1063/1.1919395
10.1063/1.1919395
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