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An ultrasmall amplitude operation of dynamic force microscopy with second flexural mode
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10.1063/1.1923200
/content/aip/journal/apl/86/19/10.1063/1.1923200
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/19/10.1063/1.1923200
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Constant second flexural resonance frequency shift images of the reconstructed surface. The resonance frequency and the quality factor were and 19 857. The images were obtained with the constant frequency shift of (a) and the amplitude of , (b) and , and (c) and .

Image of FIG. 2.
FIG. 2.

Amplitude dependence of the images. The constant frequency shifts and the amplitude were (a) and , (b) and , (c) and , (d) and , (e) and , and (f) and , respectively.

Image of FIG. 3.
FIG. 3.

A schematic drawing of the relationship between the amplitude and the interaction force simply calculated by the Lennard-Jones potential of a Si–Si bonding. (a) The amplitude of in Fig. 2(d) and 2(b) the amplitude of in Fig. 2(a). The solid lines show the equilibrium positions of the tip apex atom. The dashed lines show the closest position of the oscillation. With the reduction of the amplitude, the equilibrium position of the tip atom should approach the sample surface, but on the other hand, the closest position in the oscillation should be further from the sample.

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/content/aip/journal/apl/86/19/10.1063/1.1923200
2005-05-03
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: An ultrasmall amplitude operation of dynamic force microscopy with second flexural mode
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/19/10.1063/1.1923200
10.1063/1.1923200
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