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SEM images of (a) thin film on the Si wafer, (b) oriented -capped SiNWs, and (c) large-area -capped SiNWs with tiny silver nanocrystals attached on the tops.
XPS spectra of , , and , taken at the sputtered depth of 10 nm of the -capped Si nanowire array.
Schematic illustration of the growth process of the -capped Si nanowire array.
(a) and (b) PL and PLE spectra of thin film. (c) and (d) PL and PLE spectra of -capped Si nanowire array.
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