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(a) The characteristics of the contacts on (000-1) surface before and after the sulfide treatment. (b) The characteristic of the contact on the sulfide-treated surface (in log scale current plot).
The depth profile of an effective donor concentration along the direction determined by capacitance–voltage measurement.
The Auger depth profiles of (a) the contacts on the conventionally cleaned and (b) sulfide-treated .
(a) The XPS core level peaks obtained from the bulk and interface regions. (b) The XPS core level peak from the interface region.
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