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Transmission electron microscopy dark-field image with close to axis (parallel to the off-cut direction). Inset is a high magnification image showing the zigzag morphology of the defect.
Optical microscopy image of the as-grown epilayer surface with the carrot defect. The zigzag groove forms at the intersection of the planar defect with the sample surface.
Bright-field images of the prismatic fault termination, (a) under multibeam conditions, the fault folds to the basal plane; and (b) with , a stair-rod dislocation is visible at the crossover.
Dark-field images of the basal fault termination with (a) , and (b) .
Optical image of the etched carrot defect showing groove at the intersection of prismatic fault with the epilayer surface, two basal plane dislocation etch pits bounding the basal plane fault, and a weak line of the basal plane fault itself (marked with an arrow).
Geometric model of the carrot defect. Basal plane (B) and prismatic (P) faults are connected by a stair-rod (SR) dislocation. These faults are bounded by Frank partial (FP) and threading dislocation (TD), respectively. The defect nucleates on a threading screw dislocation propagating from the substrate.
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