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Limiting factors of room-temperature nonradiative photoluminescence lifetime in polar and nonpolar studied by time-resolved photoluminescence and slow positron annihilation techniques
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10.1063/1.1851619
/content/aip/journal/apl/86/2/10.1063/1.1851619
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/2/10.1063/1.1851619
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Figures

Image of FIG. 1.
FIG. 1.

(a) Fast and slow components of the NBE PL decay at 293 K, (b) Doppler broadening parameter of the annihilating rays of positron-electron pairs, (c) positron diffusion length , and (d) electron density in samples as a function of edge threading dislocation density (TDD). Solid and dotted lines are guide to the eye. The horizontal label N.A. for ZB samples means “not analyzed,” since the edge dislocations and stacking faults in ZB are not identical to TDs in wurtzite materials. Samples plotted by closed symbols were unintentionally doped with . The same symbols are used in Figs. 2 and 3.

Image of FIG. 2.
FIG. 2.

The relationship for the samples. Two solid lines with arrows represent the annihilation modes of positrons at (i) defect-free and (the line denoted by “”) (ii) defect-free and complex (“” line).

Image of FIG. 3.
FIG. 3.

Fast component of the TRPL decay curves at as functions of (a) parameter and (b) .

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/content/aip/journal/apl/86/2/10.1063/1.1851619
2005-01-05
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Limiting factors of room-temperature nonradiative photoluminescence lifetime in polar and nonpolar GaN studied by time-resolved photoluminescence and slow positron annihilation techniques
http://aip.metastore.ingenta.com/content/aip/journal/apl/86/2/10.1063/1.1851619
10.1063/1.1851619
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